SRP-4 Probe for Oxford/Hitachi CMI700 CMI760 CMI563 Guage

SRP-4 used in the CMI563 and CMI760 is a world-leading probe developed by Oxford Instruments' Industrial Analysis unit, which uses the microresistance principle to measure surface copper foil thickness. The SRP-4 probe is rugged and at the same time the SRP-4 probe can be adapted to small test areas, making it easy to use. SRP-4 probe tips is replaceable 1. If the probe tip is damaged, it can be replaced in time on site, which is simple to operate and minimizes the downtime of the equipment 2. The replaceable of tip reduces the cost of replacing the entire probe 3. One-stop service: Our comprehensive product range provides a complete solution for your PCB/PWB and surface copper thickness measurement needs. 1.Hitachi SRP-4 probe description: Hitachi SRP-4 probe is used for CMI700 CMI563 Series surface gauge to test the surface Cu thickness, both for Oxford and Hitachi brand guage, Standard tip (9.4mm spacing) 2.Oxford SRP-4…